Manufacturer | Part # | Datasheet | Description |
Aries Electronics, Inc. |
24001
|
724Kb / 1P |
RF Test Socket w/Replaceable Contact Strips
|
10002HT
|
716Kb / 1P |
High-Temp 250째C Universal ZIF DIPBurn-in & Test Socket ??300째C Special Order
|
Pomona Electronics |
5676A
|
41Kb / 1P |
Test Probe Set with Replaceable Tips
|
3M Electronics |
6473
|
41Kb / 1P |
Test Probe Set with Replaceable Tips
|
Pomona Electronics |
5689A
|
49Kb / 1P |
Replaceable Tip Test Probe With Banana Jack
|
5133
|
28Kb / 1P |
Test Lead Replaceable Micro Tip
|
5951A
|
38Kb / 1P |
Test Probe Set Replaceable Tip
|
6477
|
42Kb / 1P |
Replaceable Tip Test Probe Set
|
5950A
|
39Kb / 1P |
Test Probe Set Replaceable Tip
|
Aries Electronics, Inc. |
24011
|
2Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 40mm Square
|